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Home > NanoArt 2009 - 2010 Exhibition > Leonel Marques 2009, UK
PICTURE 3/4
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Noise
A tapping-mode height atomic force microscopy (AFM) image of a dibloc copolymer film made of polystyrene-b-polymethylmethacrylate 140-b-60 x103 (Mw) spun-coated onto a silicon substrate and washed with glacial acetic acid is viewed. Where the polymer is started to be seen dissolving under the action of the acid providing a lot of noise collected during the reading of the AFM tip of the surface of the sample; not enabling a correct view of the 35 nanometers (nm) nanopores along the film surface. The writing of the words: no signal was added to the image using the paint software from windows. The idea underneath this image is to provide the same effect obtained from a TV set were the connection has failed and provide a twisted or no existing image from the TV set. The only thing missing in the image will be the real existing noise associated to such situation.
Picture information
Filename:noise.jpg
Album name:Leonel Marques 2009, UK
Keywords:nanoart, atomic force microscopy, nanoparticles, nanoholes, polymer, coating, noise, TV, nanopores, silicon substrate
E-mail::paxlm2@nottigham.ac.uk
File Size:314 KB
Dimensions:600 x 600 pixels
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URL:http://nanoart21.org/nanoart-exhibitions/index.php/displayimage.php?pos=-427
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